4299 search results - page 50 / 860 » Concurrent Test Generation |
ICCAD
1997
IEEE
14 years 2 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
IJCAI
2007
13 years 11 months ago
2007
Testing embedded software systems on the control units of vehicles is a safety-relevant task, and developing the test suites for performing the tests on test benches is time-consu...
JOT
2010
13 years 8 months ago
2010
Abstract We propose a novel testing technique for object-oriented programs. Based on the state and activity models of a system, we construct an intermediate representation, which w...
PTS
2010
13 years 7 months ago
2010
We present a novel algorithm for test data generation that is based on techniques used in formal software verification. Prominent examples of such formal techniques are symbolic ex...