4299 search results - page 53 / 860 » Concurrent Test Generation |
108
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SDL
2001
15 years 3 months ago
2001
The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already ...
101
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TCAD
2010
14 years 9 months ago
2010
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
107
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INFORMATICALT
2007
15 years 2 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
113
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DATE
2007
IEEE
15 years 8 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
164
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TRUSTBUS
2004
Springer
15 years 7 months ago
2004
Springer
Abstract. Synthetic data plays an important role in software testing. In this paper, we initiate the study of synthetic data generation models for the purpose of application softwa...