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DATE
2006
IEEE
111views Hardware» more  DATE 2006»
15 years 8 months ago
Functional test generation using property decompositions for validation of pipelined processors
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...
Heon-Mo Koo, Prabhat Mishra
DFT
2006
IEEE
125views VLSI» more  DFT 2006»
15 years 8 months ago
Synthesis of Efficient Linear Test Pattern Generators
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
Avijit Dutta, Nur A. Touba
HYBRID
2007
Springer
15 years 8 months ago
Robust Test Generation and Coverage for Hybrid Systems
Abstract. Testing is an important tool for validation of the system design and its implementation. Model-based test generation allows to systematically ascertain whether the system...
A. Agung Julius, Georgios E. Fainekos, Madhukar An...
ET
2002
84views more  ET 2002»
15 years 2 months ago
Hardware Generation of Random Single Input Change Test Sequences
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
René David, Patrick Girard, Christian Landr...
TASE
2009
IEEE
15 years 9 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A...