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SIGSOFT
2007
ACM
16 years 3 months ago
The impact of input domain reduction on search-based test data generation
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
Mark Harman, Youssef Hassoun, Kiran Lakhotia, Phil...
ISSTA
2004
ACM
15 years 8 months ago
Test input generation with java PathFinder
We show how model checking and symbolic execution can be used to generate test inputs to achieve structural coverage of code that manipulates complex data structures. We focus on ...
Willem Visser, Corina S. Pasareanu, Sarfraz Khursh...
SAC
2006
ACM
15 years 2 months ago
A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...
Kai Chen, Fan Jiang, Chuan-dong Huang
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 8 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
ICS
1998
Tsinghua U.
15 years 6 months ago
Techniques for Empirical Testing of Parallel Random Number Generators
Parallel computers are now commonly used for computational science and engineering, and many applications in these areas use random number generators. For some applications, such ...
Paul D. Coddington, Sung Hoon Ko