4299 search results - page 70 / 860 » Concurrent Test Generation |
145
Voted
ICCAD
1991
IEEE
15 years 6 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
130
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TC
2008
15 years 2 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
DAC
1999
ACM
16 years 3 months ago
1999
ACM
101
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ICSE
2004
IEEE-ACM
16 years 2 months ago
2004
IEEE-ACM
We have extended the software model checker BLAST to automatically generate test suites that guarantee full coverage with respect to a given predicate. More precisely, given a C p...
116
Voted
COMPSAC
2006
IEEE
15 years 8 months ago
2006
IEEE
This paper presents an approach for automated test case generation using a software specification modeled in Statecharts. The steps defined in such approach involve: translation o...