4299 search results - page 81 / 860 » Concurrent Test Generation |
138
Voted
SIGSOFT
2003
ACM
16 years 3 months ago
2003
ACM
This paper presents a novel approach for automated test data generation of imperative programs containing integer, boolean and/or float variables. It extends our previous work to ...
135
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EURODAC
1990
IEEE
15 years 6 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
107
Voted
ET
2002
15 years 2 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
133
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ASPDAC
1998
ACM
15 years 6 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
152
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FLOPS
2010
Springer
15 years 9 months ago
2010
Springer
We present a general framework for generating SQL query test cases using Constraint Logic Programming. Given a database schema and a SQL view defined in terms of other views and s...