4299 search results - page 85 / 860 » Concurrent Test Generation |
114
Voted
DDECS
2007
IEEE
15 years 9 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
120
Voted
GLVLSI
2002
IEEE
15 years 7 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
104
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DATE
2005
IEEE
15 years 8 months ago
2005
IEEE
Our goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation ...
122
Voted
SE
2008
15 years 4 months ago
2008
: In this paper, we discuss one approach of automated test case generation from UML models and OCL expressions. We show how to use UML and OCL to support several coverage criteria....
100
Voted
ECAI
2008
Springer
15 years 4 months ago
2008
Springer
This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framewo...