4299 search results - page 89 / 860 » Concurrent Test Generation |
157
Voted
ASPLOS
2011
ACM
14 years 6 months ago
2011
ACM
Concurrency bugs are caused by non-deterministic interleavings between shared memory accesses. Their effects propagate through data and control dependences until they cause softwa...
102
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VTS
2005
IEEE
15 years 8 months ago
2005
IEEE
TARO test patterns are transition fault test patterns that sensitize each transition fault to all of the outputs that can be reached from the fault location. We were not able to i...
120
Voted
SIGSOFT
2007
ACM
16 years 3 months ago
2007
ACM
The testing of the performance of opportunistic communication protocols and applications is usually done through simulation as i) deployments are expensive and should be left to t...
110
Voted
KBSE
2005
IEEE
15 years 8 months ago
2005
IEEE
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
151
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AICT
2008
IEEE
15 years 2 months ago
2008
IEEE
This paper presents the simplified method of random test suite based on the frequency (block) test. The test is used to check the first property of random numbers which is to have ...