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139
Voted
ICST
2009
IEEE
15 years 9 months ago
2009
IEEE
The problem of testing from an extended finite state machine (EFSM) can be expressed in terms of finding suitable paths through the EFSM and then deriving test data to follow the ...
125
Voted
ISMVL
2005
IEEE
15 years 8 months ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
125
Voted
TCAD
2002
15 years 2 months ago
2002
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
119
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VLSID
2009
IEEE
16 years 3 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
129
Voted
ISSTA
2007
ACM
15 years 4 months ago
2007
ACM
As concurrent and distributive applications are becoming more common and debugging such applications is very difficult, practical tools for automatic debugging of concurrent appl...