: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev...
We present a study of the effects of disk and memory corruption on file system data integrity. Our analysis focuses on Sun's ZFS, a modern commercial offering with numerous r...
Yupu Zhang, Abhishek Rajimwale, Andrea C. Arpaci-D...
Processor cycle time continues to decrease faster than main memory access times, placing higher demands on cache memory hierarchy performance. To meet these demands, conventional ...
Alvin R. Lebeck, David R. Raymond, Chia-Lin Yang, ...
For years, the computation rate of processors has been much faster than the access rate of memory banks, and this divergence in speeds has been constantly increasing in recent yea...
Guy E. Blelloch, Phillip B. Gibbons, Yossi Matias,...
ract problem of using P failure-prone processors to cooperatively update all locations of an N-element shared array is called Write-All. Solutions to Write-All can be used iterati...
Chryssis Georgiou, Alexander Russell, Alexander A....