49 search results - page 3 / 10 » Considering process variations during system-level power ana... |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Advanced process technologies impose more significant challenges especially when manufactured circuits exhibit substantial process variations. Consideration of process variations...
TVLSI
2008
13 years 7 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
FDL
2003
IEEE
14 years 22 days ago
2003
IEEE
The paper presents a methodology to integrate information on power consumption in a high level functional description of a System-on-chip. The power dissipated during the executio...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
An approach to robust system level mixed signal design is presented based on analog platforms. The bottom-up characterization phase of platform components provides accurate perfor...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...