189 search results - page 19 / 38 » Constrained Monte Carlo and the method of control variates |
SIGGRAPH
1992
ACM
13 years 11 months ago
1992
ACM
We present a new approachto interactive modeling of freeform surfaces. Instead of a fixed mesh of control points, the model presented to the user is that of an infinitely malleabl...
TCAD
2010
13 years 2 months ago
2010
The Monte-Carlo (MC) technique is a traditional solution for a reliable statistical analysis, and in contrast to probabilistic methods, it can account for any complicate model. How...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
TCAD
2010
13 years 2 months ago
2010
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
FTEDA
2006
13 years 7 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...