Stochastic variational analysis of large power grids considering intra-die correlations

For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctuations due to process variations is inevitable. In this paper, we propose an efficient algorithm for the variational analysis of large power grids in the presence of a significant number of Gaussian intra-die process variables that are correlated. We consider variations in the power grid's electrical parameters as spatial stochastic processes and express them as mean-square convergent linear expansions in an orthonormal series of random variables using the Karhunen-Lo`eve (KLE) method. The voltage response is then represented as an orthonormal polynomial series in these random variables. The series is truncated and the coefficients are obtained optimally using the Galerkin method. In doing so, we propose a novel method to separate the stochastic analysis for the random variables that effect only the input...

• Type: Conference
• Year: 2006
• Where: DAC
• Authors: Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhardwaj, Rajendran Panda
• Keywords: DAC 2006, Design Automation, Keywords Power Grids, Large Power Grids, Power Grids