892 search results - page 11 / 179 » Coordinated Scan Detection |
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
ISBI
2004
IEEE
14 years 9 months ago
2004
IEEE
We have simulated 2D PET acquisitions of an anthropomorphic phantom with numerous spherical target lesions. The diameters of the lesions were varied from
ICRA
2009
IEEE
14 years 3 months ago
2009
IEEE
FSR
2005
Springer
14 years 2 months ago
2005
Springer
DEXA
2007
Springer
14 years 16 days ago
2007
Springer
