1401 search results - page 46 / 281 » Cost-Sensitive Test Strategies |
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or IDDQ testing. Theoretica...
ITC
1993
IEEE
14 years 1 months ago
1993
IEEE
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
MVA
2000
13 years 10 months ago
2000
Content-based image retrieval is a fairly new discipline. Yet research in this field has highlighted many approaches that show good performance in specific subproblems using singl...
ML
2008
ACM
13 years 9 months ago
2008
ACM
It is well-known that heuristic search in ILP is prone to plateau phenomena. An explanation can be given after the work of Giordana and Saitta: the ILP covering test is NP-complete...
ECCV
2006
Springer
14 years 11 months ago
2006
Springer
Abstract. Bag-of-features representations have recently become popular for content based image classification owing to their simplicity and good performance. They evolved from text...