1401 search results - page 7 / 281 » Cost-Sensitive Test Strategies |
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
EGOV
2008
Springer
13 years 9 months ago
2008
Springer
In this paper we present a framework for identifying the test focus and test objectives based on the assumption that automatic information processing based on encoded meaning is th...
ITC
2003
IEEE
14 years 28 days ago
2003
IEEE
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
DDECS
2008
IEEE
14 years 2 months ago
2008
IEEE
— Testing SoC is a challenging task, especially when addressing complex and highfrequency devices. Among the different techniques that can be exploited, Software-Based Selft-Test...
ICST
2011
IEEE
12 years 11 months ago
2011
IEEE
—Test-suite augmentation for evolving software— the process of augmenting a test suite to adequately test software changes—is necessary for any program that undergoes modifi...