1944 search results - page 128 / 389 » Coupling-based Integration Testing |
ICCD
2008
IEEE
14 years 7 months ago
2008
IEEE
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
DAC
2005
ACM
14 years 7 days ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
ICDE
2009
IEEE
13 years 8 months ago
2009
IEEE
The identification and processing of similarities in the data play a key role in multiple application scenarios. Several types of similarity-aware operations have been studied in ...
ASPDAC
2012
ACM
12 years 6 months ago
2012
ACM
In this paper, we examine the integration potential and explore the design space of low power thermal reliable on-chip interconnect synthesis featuring nanophotonics Wavelength Di...
CVPR
2012
IEEE
12 years 21 days ago
2012
IEEE
Widespread current cameras are part of multisensory systems with an integrated computer (smartphones). Computer vision thus starts evolving to cross-modal sensing, where vision an...