1944 search results - page 159 / 389 » Coupling-based Integration Testing |
SIGMOD
2012
ACM
12 years 25 days ago
2012
ACM
The success of data-driven solutions to difficult problems, along with the dropping costs of storing and processing massive amounts of data, has led to growing interest in largesc...
DAC
2007
ACM
14 years 11 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
ISLPED
2009
ACM
14 years 4 months ago
2009
ACM
Post-fabrication tuning for mitigating manufacturing variability is receiving a significant attention. To reduce leakage increase involved in performance compensation by body bia...
SP
2008
IEEE
14 years 4 months ago
2008
IEEE
Attacks often exploit memory errors to gain control over the execution of vulnerable programs. These attacks remain a serious problem despite previous research on techniques to pr...
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper proposes a novel HW/SW co-simulation approach that minimizes the impact on software designers. We propose a SystemC-based system that enables the software team to test ...