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DATE
2002
IEEE
98views Hardware» more  DATE 2002»
14 years 14 days ago
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
Michael Pronath, Helmut E. Graeb, Kurt Antreich
ITC
1996
IEEE
107views Hardware» more  ITC 1996»
13 years 11 months ago
Digital Integrated Circuit Testing using Transient Signal Analysis
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
UIST
2006
ACM
14 years 1 months ago
Reflective physical prototyping through integrated design, test, and analysis
Prototyping is the pivotal activity that structures innovation, collaboration, and creativity in design. Prototypes embody design hypotheses and enable designers to test them. Fra...
Björn Hartmann, Scott R. Klemmer, Michael Ber...
ICLP
2009
Springer
14 years 8 months ago
Integrating Software Testing and Run-Time Checking in an Assertion Verification Framework
Abstract. We present a framework that unifies unit testing and runtime verification (as well as static verification and static debugging). A key contribution of our overall approac...
Edison Mera, Manuel V. Hermenegildo, Pedro L&oacut...
COMPSAC
2007
IEEE
14 years 1 months ago
Learning Parameterized State Machine Model for Integration Testing
Although many of the software engineering activities can now be model-supported, the model is often missing in software development. We are interested in retrieving statemachine m...
Muzammil Shahbaz, Keqin Li 0002, Roland Groz