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DATE
2006
IEEE
78views Hardware» more  DATE 2006»
14 years 1 months ago
Functional constraints vs. test compression in scan-based delay testing
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
Ilia Polian, Hideo Fujiwara
ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
14 years 25 days ago
Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanja...
COMPSAC
2002
IEEE
14 years 15 days ago
Hypothesis Testing for Module Test in Software Development
One of the most important issues in the software development is how to guarantee that the software satisfies the quality defined in the requirement specification. This paper pr...
Tsuneo Yamaura, Akira K. Onoma, Wei-Tek Tsai
UML
2001
Springer
13 years 12 months ago
A UML-integrated Test Description Language for Component Testing
Abstract: A mass market in reusable components demands a high level of component quality, testing being a crucial part of software quality assurance. For components modelled in UML...
Simon Pickin, Claude Jard, Thierry Heuillard, Jean...
FORTE
2004
13 years 9 months ago
Model-Checking Plus Testing: From Software Architecture Analysis to Code Testing
Software Model-Checking and Testing are some of the most used techniques to analyze software systems and identify hidden faults. While software model-checking allows for an exhaust...
Antonio Bucchiarone, Henry Muccini, Patrizio Pelli...