1944 search results - page 27 / 389 » Coupling-based Integration Testing |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
CSIE
2009
IEEE
13 years 8 months ago
2009
IEEE
Succinct test script with high efficiency is one of key point for automation of embedded software testing. In this paper, we integrated object technique with automated simulation ...
KES
2008
Springer
13 years 7 months ago
2008
Springer
Software testing is an integral part of software engineering. Lack of testing often leads to disastrous consequences including loss of data, fortunes, and even lives. In order to e...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...