1944 search results - page 29 / 389 » Coupling-based Integration Testing |
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
COMPSAC
2009
IEEE
14 years 8 days ago
2009
IEEE
—In continuous integration, a tight integration of test case prioritization techniques and fault-localization techniques may both expose failures faster and locate faults more ef...
TAICPART
2010
IEEE
13 years 6 months ago
2010
IEEE
We report on how the Wrangler refactoring tool has been used to improve and transform test code for Erlang systems. This has been achieved through the removal of code clones, the i...
AIPS
1994
13 years 9 months ago
1994
A robot system operating in an environmentin which there is uncertainty and changeneeds to combinethe ability to react withthe ability to plan ahead. In a previous paper wepropose...