1944 search results - page 31 / 389 » Coupling-based Integration Testing |
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
ISSRE
2000
IEEE
13 years 12 months ago
2000
IEEE
The emphasis in object-oriented programs is on defining abstractions that have both state and behavior. This emphasis causes a shift in focus from software units to the way softw...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...
INTEGRATION
2006
13 years 7 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
ECBS
2011
IEEE
12 years 7 months ago
2011
IEEE
Abstract—With the availability of the off-the-shelf quadrocopter platforms, the implementation of autonomous unmanned aerial vehicle (UAV) has substantially been simplified. Suc...