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TIFS
2008
120views more  TIFS 2008»
13 years 7 months ago
Determining Image Origin and Integrity Using Sensor Noise
In this paper, we provide a unified framework for identifying the source digital camera from its images and for revealing digitally altered images using photo-response nonuniformit...
Mo Chen, Jessica J. Fridrich, Miroslav Goljan, Jan...
FORTE
1997
13 years 9 months ago
A Framework for Distributed Object-Oriented Testing
Distributed programming and object-oriented programming are two popular programming paradigms. The former is driven by advances in networking technology whereas the latter provide...
Alan C. Y. Wong, Samuel T. Chanson, Shing-Chi Cheu...
DATE
2000
IEEE
87views Hardware» more  DATE 2000»
14 years 13 hour ago
Test Synthesis for Mixed-Signal SOC Paths
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
ESCIENCE
2007
IEEE
14 years 1 months ago
An Integrated Grid Development Environment in Eclipse
With the proliferation of Grid computing, a large number of computational resources are available for solving complex scientific and engineering problems. Nevertheless, it is non-...
Donny Kurniawan, David Abramson
VTS
2006
IEEE
95views Hardware» more  VTS 2006»
14 years 1 months ago
Integrated CMOS Power Sensors for RF BIST Applications
This paper presents the design and experimental results of fully integrated CMOS power sensors for RF built-in self-test (BIST) applications. Using a standard 0.18- m CMOS process...
Hsieh-Hung Hsieh, Liang-Hung Lu