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EVOW
2001
Springer
15 years 6 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
DATE
1997
IEEE
92views Hardware» more  DATE 1997»
15 years 6 months ago
MOSAIC: a multiple-strategy oriented sequential ATPG for integrated circuits
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
A. Dargelas, C. Gauthron, Yves Bertrand
COMPSAC
2001
IEEE
15 years 5 months ago
Scenario-Based Functional Regression Testing
Regression testing has been a popular quality assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based fu...
Raymond A. Paul, Lian Yu, Wei-Tek Tsai, Xiaoying B...
DAGSTUHL
2004
15 years 3 months ago
UML 2.0 Testing Profile
Testing often accounts for more than 50% of the required effort during system development. However, testing is often not well integrated with other development phases. One reason ...
Zhen Ru Dai
AGILEDC
2007
IEEE
15 years 8 months ago
Performance Testing on an Agile Project
This experience report is about a software process, designed with performance testing in mind, was used to create a mission critical integration layer. This report focuses on how ...
Jamie Dobson