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EVOW
2001
Springer
14 years 2 days ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
DATE
1997
IEEE
92views Hardware» more  DATE 1997»
13 years 11 months ago
MOSAIC: a multiple-strategy oriented sequential ATPG for integrated circuits
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
A. Dargelas, C. Gauthron, Yves Bertrand
COMPSAC
2001
IEEE
13 years 11 months ago
Scenario-Based Functional Regression Testing
Regression testing has been a popular quality assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based fu...
Raymond A. Paul, Lian Yu, Wei-Tek Tsai, Xiaoying B...
DAGSTUHL
2004
13 years 9 months ago
UML 2.0 Testing Profile
Testing often accounts for more than 50% of the required effort during system development. However, testing is often not well integrated with other development phases. One reason ...
Zhen Ru Dai
AGILEDC
2007
IEEE
14 years 1 months ago
Performance Testing on an Agile Project
This experience report is about a software process, designed with performance testing in mind, was used to create a mission critical integration layer. This report focuses on how ...
Jamie Dobson