1944 search results - page 6 / 389 » Coupling-based Integration Testing |
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
AWCC
2004
Springer
14 years 26 days ago
2004
Springer
This paper proposes progressive group testing techniques to test large number of Web services (WS) available on Internet. At the unit testing level, the WS with the same functional...
SIGSOFT
2010
ACM
13 years 5 months ago
2010
ACM
During maintenance, software is modified and evolved to enhance its functionality, eliminate faults, and adapt it to changed or new platforms. In this demo, we present BERT, a too...
COMPSAC
2005
IEEE
14 years 1 months ago
2005
IEEE
Many approaches exist to decide the order in which classes should be integrated during (integration) testing. Most of them, based on an analysis of class dependencies (for instanc...