1944 search results - page 7 / 389 » Coupling-based Integration Testing |
COMPSAC
2001
IEEE
13 years 11 months ago
2001
IEEE
In recent years, several techniques have been proposed for class-level regression testing. Most of these techniques focus either on white- or black-box testing, although an integr...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
The test time for core-external interconnect shorts/opens is typically much less than that for core-internal logic. Therefore, prior work on test infrastructure design for core-ba...
APAQS
2001
IEEE
13 years 11 months ago
2001
IEEE
Integration testing has always been a challenge especially if the system under test is large with many subsystems and interfaces. This paper proposes an approach to design End-toE...
ICST
2009
IEEE
13 years 5 months ago
2009
IEEE
Measurement and detection of redundancy in test suites attempt to achieve test minimization which in turn can help reduce test maintenance costs, and to also ensure the integrity ...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...