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DATE
2009
IEEE
106views Hardware» more  DATE 2009»
14 years 2 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
SAC
2008
ACM
13 years 7 months ago
PHALANX: a graph-theoretic framework for test case prioritization
Test case prioritization for regression testing can be performed using different metrics (e.g., statement coverage, path coverage) depending on the application context. Employing ...
Murali Krishna Ramanathan, Mehmet Koyutürk, A...
ATVA
2006
Springer
102views Hardware» more  ATVA 2006»
13 years 11 months ago
A Semantic Framework for Test Coverage
Abstract. Since testing is inherently incomplete, test selection is of vital importance. Coverage measures evaluate the quality of a test suite and help the tester select test case...
Laura Brandán Briones, Ed Brinksma, Mari&eu...
ICCAD
1996
IEEE
141views Hardware» more  ICCAD 1996»
13 years 11 months ago
An observability-based code coverage metric for functional simulation
Functional simulation is the most widely used method for design verification. At various levels of abstraction, e.g., behavioral, register-transfer level and gate level, the design...
Srinivas Devadas, Abhijit Ghosh, Kurt Keutzer
ICSM
2009
IEEE
14 years 2 months ago
Introducing a test suite similarity metric for event sequence-based test cases
Most of today’s event driven software (EDS) systems are tested using test cases that are carefully constructed as sequences of events; they test the execution of an event in the...
Penelope A. Brooks, Atif M. Memon