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ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
13 years 12 months ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
ISSTA
2004
ACM
14 years 1 months ago
Evolutionary testing of classes
Object oriented programming promotes reuse of classes in multiple contexts. Thus, a class is designed and implemented with several usage scenarios in mind, some of which possibly ...
Paolo Tonella
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
14 years 2 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
DFT
2003
IEEE
120views VLSI» more  DFT 2003»
14 years 1 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
PRICAI
2000
Springer
13 years 11 months ago
Improved Efficiency of Oil Well Drilling through Case Based Reasoning
A system that applies a method of knowledge-intensive case-based reasoning, for repair and prevention of unwanted events in the domain of offshore oil well drilling, has been deve...
Pål Skalle, Jostein Sveen, Agnar Aamodt