27 search results - page 1 / 6 » DRAM reliability |
DAC
2009
ACM
14 years 12 months ago
2009
ACM
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
CODES
2011
IEEE
12 years 10 months ago
2011
IEEE
Designing memory controllers for complex real-time and highperformance multi-processor systems-on-chip is challenging, since sufficient capacity and (real-time) performance must b...
ISCA
2012
IEEE
12 years 1 months ago
2012
IEEE
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
ASPLOS
2010
ACM
14 years 5 months ago
2010
ACM
DRAM is facing severe scalability challenges in sub-45nm technology nodes due to precise charge placement and sensing hurdles in deep-submicron geometries. Resistive memories, suc...
MR
2002
13 years 10 months ago
2002
