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TASE
2011
IEEE
13 years 2 months ago
Multiclass Flow Line Models of Semiconductor Manufacturing Equipment for Fab-Level Simulation
—For multiclass flow line models, we identify a class of service times that allow a decomposition of the system into subsets of servers called channels. In each channel, the cus...
James R. Morrison
IISWC
2009
IEEE
14 years 2 months ago
On the (dis)similarity of transactional memory workloads
— Programming to exploit the resources in a multicore system remains a major obstacle for both computer and software engineers. Transactional memory offers an attractive alternat...
Clay Hughes, James Poe, Amer Qouneh, Tao Li
DFT
2005
IEEE
72views VLSI» more  DFT 2005»
14 years 1 months ago
Soft Error Modeling and Protection for Sequential Elements
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
Hossein Asadi, Mehdi Baradaran Tahoori
GLVLSI
2007
IEEE
189views VLSI» more  GLVLSI 2007»
14 years 1 months ago
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
Paolo Bernardi, Michelangelo Grosso, Matteo Sonza ...
INFOCOM
2006
IEEE
14 years 1 months ago
TWINE: A Hybrid Emulation Testbed for Wireless Networks and Applications
In this paper, we present a high fidelity and efficient emulation framework called TWINE, which combines the accuracy and realism of emulated and physical networks and the scala...
Junlan Zhou, Zhengrong Ji, Rajive Bagrodia