1290 search results - page 127 / 258 » Data Dependence Testing in Practice |
ICCV
2003
IEEE
15 years 1 days ago
2003
IEEE
The objective of active recognition is to iteratively collect the next "best" measurements (e.g., camera angles or viewpoints), to maximally reduce ambiguities in recogn...
DAC
2003
ACM
14 years 11 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...
CHI
2002
ACM
14 years 10 months ago
2002
ACM
Informal, sketch-based design tools closely match the work practices of user interface designers. Current tools, however, are limited in the size and complexity of interaction tha...
DSN
2009
IEEE
14 years 4 months ago
2009
IEEE
This work explores the principles and practice of isolating low-level device drivers in order to improve OS dependability. In particular, we explore the operations drivers can per...
ATAL
2009
Springer
14 years 4 months ago
2009
Springer
Decentralized partially observable MDPs (DEC-POMDPs) provide a rich framework for modeling decision making by a team of agents. Despite rapid progress in this area, the limited sc...