1368 search results - page 17 / 274 » Data Engineering for the Analysis of Semiconductor Manufactu... |
WSC
2008
13 years 10 months ago
2008
Within the last months the semiconductor plant of Infineon in Dresden has converted to a pure manufacturer of logic products. With it, premises for production control have changed...
DMIN
2006
13 years 9 months ago
2006
Process monitoring refers to the task of detecting abnormal process operations resulting from the shift in the mean and/or the variance of one or more process variables. To success...
ITC
2003
IEEE
14 years 26 days ago
2003
IEEE
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
ARCS
2004
Springer
14 years 1 months ago
2004
Springer
: We investigated different parallel SIMD (single instruction multiple data) architectures based on pure programmable and reconfigurable approaches for their appropriateness for in...
EDBT
2006
ACM
14 years 7 months ago
2006
ACM
In [12] we introduce a novel architecture for data processing, based on a functional fusion between a data and a computation layer. In this demo we show how this architecture is le...