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DATE
2008
IEEE
115views Hardware» more  DATE 2008»
15 years 10 months ago
Improving the Efficiency of Run Time Reconfigurable Devices by Configuration Locking
Run-time reconfigurable logic is a very attractive alterative in the design of SoC. However, configuration overhead can largely decrease the system performance. In this work, we p...
Yang Qu, Juha-Pekka Soininen, Jari Nurmi
DATE
2008
IEEE
139views Hardware» more  DATE 2008»
15 years 10 months ago
Instruction Re-encoding Facilitating Dense Embedded Code
Reducing the code size of embedded applications is one of the important constraint in embedded system design. Code compression can provide substantial savings in terms of size. In...
Talal Bonny, Jörg Henkel
DATE
2008
IEEE
106views Hardware» more  DATE 2008»
15 years 10 months ago
Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
Anshuman Chandra, Felix Ng, Rohit Kapur
DATE
2008
IEEE
121views Hardware» more  DATE 2008»
15 years 10 months ago
On Automated Trigger Event Generation in Post-Silicon Validation
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
Ho Fai Ko, Nicola Nicolici
DATE
2008
IEEE
104views Hardware» more  DATE 2008»
15 years 10 months ago
Diagnostic Analysis of Static Errors in Multi-Step Analog to Digital Converters
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
Amir Zjajo, José Pineda de Gyvez