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DATE
2005
IEEE
155views Hardware» more  DATE 2005»
15 years 10 months ago
Studying Storage-Recomputation Tradeoffs in Memory-Constrained Embedded Processing
Fueled by an unprecedented desire for convenience and self-service, consumers are embracing embedded technology solutions that enhance their mobile lifestyles. Consequently, we wi...
Mahmut T. Kandemir, Feihui Li, Guilin Chen, Guangy...
DATE
2005
IEEE
153views Hardware» more  DATE 2005»
15 years 10 months ago
Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
Smita Krishnaswamy, George F. Viamontes, Igor L. M...
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 10 months ago
Encoding-Based Minimization of Inductive Cross-Talk for Off-Chip Data Transmission
Inductive cross-talk within IC packaging is becoming a significant bottleneck in high-speed inter-chip communication. The parasitic inductance within IC packaging causes bounce o...
Brock J. LaMeres, Sunil P. Khatri
DATE
2005
IEEE
118views Hardware» more  DATE 2005»
15 years 10 months ago
A Tool and Methodology for AC-Stability Analysis of Continuous-Time Closed-Loop Systems
—Presented are a methodology and a DFII-based tool for AC-stability analysis of a wide variety of closed-loop continuous-time (operational amplifiers and other linear circuits). ...
Momchil Milev, Rod Burt
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 10 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt