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169
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
The new standard DRM for digital radio broadcast in AM band requires integrated devices for radio receivers at low cost and very low power consumption. A chipset is currently desi...
148
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
177
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DATE
2010
IEEE
15 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
121
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DATE
2010
IEEE
15 years 10 months ago
2010
IEEE
- Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while...
142
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DATE
2010
IEEE
15 years 10 months ago
2010
IEEE
—We present a new language called Precision Timed C, for predictable and lightweight multithreading in C. PRET-C supports synchronous concurrency, preemption, and a high-level co...