67 search results - page 10 / 14 » Defect Aware Test Patterns |
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
ICST
2011
IEEE
12 years 11 months ago
2011
IEEE
—Static analysis tools have been widely used to detect potential defects without executing programs. It helps programmers raise the awareness about subtle correctness issues in t...
SIGMOD
2005
ACM
14 years 7 months ago
2005
ACM
A defining characteristic of continuous queries over on-line data streams, possibly bounded by sliding windows, is the potentially infinite and time-evolving nature of their input...
ICPP
2006
IEEE
14 years 1 months ago
2006
IEEE
These days an increasing number of applications, especially in science and engineering, are dealing with a massive amount of data; hence they are dataintensive. Bioinformatics, da...