67 search results - page 5 / 14 » Defect Aware Test Patterns |
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Faster-than-at-speed test have been proposed to detect small delay defects. While these techniques increase the test frequency to reduce the positive slack of the path, they exace...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
MTDT
2003
IEEE
14 years 20 days ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
ITC
1991
IEEE
13 years 11 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...