67 search results - page 8 / 14 » Defect Aware Test Patterns |
ICST
2008
IEEE
14 years 1 months ago
2008
IEEE
Evidence suggests that as software ages the original realizations of design patterns remain in place, and participants in design pattern realizations accumulate “grime” – no...
SEW
2007
IEEE
14 years 1 months ago
2007
IEEE
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
INFORMATICALT
2008
13 years 7 months ago
2008
This paper is concerned with the problem of image analysis based detection of local defects embedded in particleboard surfaces. Though simple, but efficient technique developed is ...
DATE
2002
IEEE
14 years 11 days ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
CVPR
2010
IEEE
13 years 8 months ago
2010
IEEE
We present a simple, fast, and effective method to detect defects on textured surfaces. Our method is unsupervised and contains no learning stage or information on the texture bei...