67 search results - page 9 / 14 » Defect Aware Test Patterns |
JCIT
2010
13 years 2 months ago
2010
Artificial Neural Networks(ANNS) have top level of capability to progress the estimation of cracks in metal tubes. The aim of this paper is to propose an algorithm to identify mod...
ICIAR
2004
Springer
14 years 24 days ago
2004
Springer
The automated flaw detection in aluminium castings consists of two steps: a) identification of potential defects using image processing techniques, and b) classification of pote...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
MSR
2006
ACM
14 years 1 months ago
2006
ACM
Various static analysis tools will analyze a software artifact in order to identify potential defects, such as misused APIs, race conditions and deadlocks, and security vulnerabil...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...