41 search results - page 4 / 9 » Defect Tolerance in Multiple-FPGA Systems |
IPPS
2010
IEEE
13 years 7 months ago
2010
IEEE
We present new methods to extend data reliability of disks in RAID systems for applications like long term data archival. The proposed solutions extend existing algorithms to detec...
VLSID
2007
IEEE
14 years 10 months ago
2007
IEEE
Recent advances in microfluidics technology have led to the emergence of miniaturized biochip devices for biochemical analysis. A promising category of microfluidic biochips relie...
MICRO
2007
IEEE
14 years 4 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
ASPLOS
2006
ACM
14 years 3 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
MICRO
2010
IEEE
13 years 7 months ago
2010
IEEE
Single-thread performance, reliability and power efficiency are critical design challenges of future multicore systems. Although point solutions have been proposed to address thes...