We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any pe...
Parallel processors such as SIMD computers have been successfully used in various areas of high performance image and data processing. Due to their characteristics of highly regula...
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lomb...