48 search results - page 9 / 10 » Defect tolerance for nanocomputer architecture |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
This paper presents a technique to improve the storage density of spin-torque transfer (STT) magnetoresistive random access memory (MRAM) in the presence of significant magnetic t...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
CDES
2006
13 years 9 months ago
2006
Abstract--This paper describes an architecture of FPGAlike fabric for future hybrid "CMOL" circuits. Such circuits will combine a semiconductor-transistor (CMOS) stack an...
DSN
2007
IEEE
14 years 1 months ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...