32 search results - page 3 / 7 » Deformations of IC Structure in Test and Yield Learning |
CORR
2008
Springer
13 years 7 months ago
2008
Springer
In this paper, the high density out-of-plane microprobe array is demonstrated. The fabrication processes of proposed device including bulk micromachining, thin film deposition and ...
CVPR
2008
IEEE
13 years 9 months ago
2008
IEEE
In this paper, we develop a geometric framework for linear or nonlinear discriminant subspace learning and classification. In our framework, the structures of classes are conceptu...
GECCO
2004
Springer
14 years 26 days ago
2004
Springer
Most problems studied in artificial intelligence possess some form of structure, but a precise way to define such structure is so far lacking. We investigate how the notion of pr...
TMI
1998
13 years 7 months ago
1998
Abstract— This paper reports a novel method for fully automated segmentation that is based on description of shape and its variation using point distribution models (PDM’s). An...
JMLR
2007
13 years 7 months ago
2007
We introduce standardised building blocks designed to be used with variational Bayesian learning. The blocks include Gaussian variables, summation, multiplication, nonlinearity, a...