32 search results - page 4 / 7 » Deformations of IC Structure in Test and Yield Learning |
VLSID
1998
IEEE
13 years 11 months ago
1998
IEEE
With several commercial tools becoming available, the high-level synthesis of applicationspeci c integrated circuits is nding wide spread acceptance in VLSI industry today. Existi...
AIED
2007
Springer
14 years 1 months ago
2007
Springer
We compare the relative utility of different automatically computable linguistic feature sets for modeling student learning in computer dialogue tutoring. We use the PARADISE frame...
ICDM
2009
IEEE
14 years 2 months ago
2009
IEEE
A pervasive problem in large relational databases is identity uncertainty which occurs when multiple entries in a database refer to the same underlying entity in the world. Relati...
BMCBI
2007
13 years 7 months ago
2007
Background: Many protein sequences are still poorly annotated. Functional characterization of a protein is often improved by the identification of its interaction partners. Here, ...
ICCV
2009
IEEE
15 years 14 days ago
2009
IEEE
We present a shape-based algorithm for detecting and
recognizing non-rigid objects from natural images. The existing
literature in this domain often cannot model the objects
ver...