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DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
ICIW
2009
IEEE
14 years 2 months ago
2009
IEEE
Today’s cross-organizations are increasingly coordinating their capabilities in the quest of dynamically adaptable and thus highly competitive realistic services. Unfortunately,...
IEEEPACT
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—As programmers are asked to manage more complicated parallel machines, it is likely that they will become increasingly dependent on tools such as multi-threaded data rac...
CGO
2008
IEEE
14 years 2 months ago
2008
IEEE
The recent trend in the processor industry of packing multiple processor cores in a chip has increased the importance of automatic techniques for extracting thread level paralleli...
ISPASS
2008
IEEE
14 years 2 months ago
2008
IEEE
Although the best processor design for executing a specific workload does depend on the characteristics of the workload, it can not be determined without factoring-in the effect o...