59 search results - page 3 / 12 » Design Error Diagnosis in Digital Circuits without Error Mod... |
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
—Two probabilistic-based models, namely the Ensemble-Dependent Matrix model [1][3] and the Markov Random Field model [2], have been proposed to deal with faults in nanoscale syst...
WCE
2007
13 years 8 months ago
2007
—Clock jitter and its effects on signal-to-noise ratio (SNR) were widely investigated in the published literatures. However, most of the issues mainly focused on white-Gaussian-n...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
FMCAD
2007
Springer
13 years 11 months ago
2007
Springer
As VLSI fabrication technology progresses to 65nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates verifying digital circuits using contin...