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» Design For Testability Method for CML Digital Circuits
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FMCAD
2007
Springer
13 years 11 months ago
Circuit Level Verification of a High-Speed Toggle
As VLSI fabrication technology progresses to 65nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates verifying digital circuits using contin...
Chao Yan, Mark R. Greenstreet
FM
2003
Springer
107views Formal Methods» more  FM 2003»
14 years 27 days ago
A Formal Framework for Modular Synchronous System Design
We present the formal framework for a novel approach for specifying and automatically implementing systems such as digital circuits and network protocols. The goal is to reduce the...
Maria-Cristina V. Marinescu, Martin C. Rinard
DATE
2008
IEEE
104views Hardware» more  DATE 2008»
14 years 2 months ago
Diagnostic Analysis of Static Errors in Multi-Step Analog to Digital Converters
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
Amir Zjajo, José Pineda de Gyvez
DAC
2006
ACM
14 years 1 months ago
Automated design of pin-constrained digital microfluidic arrays for lab-on-a-chip applications*
Microfluidics-based biochips, also referred to as lab-on-a-chip (LoC), are devices that integrate fluid-handling functions such as sample preparation, analysis, separation, and de...
William L. Hwang, Fei Su, Krishnendu Chakrabarty
ECCTD
2011
72views more  ECCTD 2011»
12 years 7 months ago
Managing variability for ultimate energy efficiency
⎯ Technology scaling is in the era where the chip performance is constrained by its power dissipation. Although the power limits vary with the application domain, they dictate th...
Borivoje Nikolic