123 search results - page 20 / 25 » Design For Testability Method for CML Digital Circuits |
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
SLIP
2005
ACM
14 years 1 months ago
2005
ACM
Routability optimization has become a major concern in the physical design cycle of VLSI circuits. Due to the recent advances in VLSI technology, interconnect has become a dominan...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
We describe a new extraction tool, EMX (Electro-Magnetic eXtractor), for the analysis of RF, analog and high-speed digital circuits. EMX is a fast full-wave field solver. It incor...
SENSYS
2004
ACM
14 years 1 months ago
2004
ACM
The enormous potential for wireless sensor networks to make a positive impact on our society has spawned a great deal of research on the topic, and this research is now producing ...