Heat removal and power delivery have become two major reliability concerns in 3D stacked IC technology. For thermal problem, two possible solutions exist: thermal-through-silicon-...
This paper presents a methodology for cycle-accurate simulation of energy dissipation in embedded systems. The ARM Ltd. 1 instruction-level cycle-accurate simulator is extended wi...
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...
Dongkook Park, Chrysostomos Nicopoulos, Jongman Ki...
The high demand for large scale storage capacity calls for the availability of massive storage solutions with high performance interconnects. Although cluster file systems are rap...
This chapter addresses the problem of producing and maintaining progress in agent design. New architectures often hold important insights into the problems of designing intelligenc...